In the well-established manufacturing processes of the semiconductor industry, robots and CVD/PVD machines can be commonly seen. Robots quickly move wafers from different production lines to increase the production yield and CVD/PVD machines are used to form a thin film on wafers. To capture data from these machines, the industry needs advanced data acquisition and analysis capabilities to boost continuous machine operation and production yields.

Advantech industrial remote I/O modules such as ADAM-6217, and EKI- 2728 switches effectively capture key parameters via Ethernet and simultaneously transmit data to VM servers for analysis, which helps improve semiconductor management, machine efficiency, and production stability.

Wafer surface damage and scratch defects need to be located during the CMP (chemical mechanical planarization) process to ensure wafer surface purity and planarity.

Advantech offers a machine vision inspection solution covering

industrial-grade image sensors, high-level computing industrial PC IPC-220, frame grabber card PCIE-1674E-AE, industrial cameras, and the VisionNavi application software to deliver precise and efficient semiconductor production.

Many hazardous chemicals are used in high-tech industries such as semiconductor manufacturing. Not only are these chemicals dangerous and polluting, their waste disposal is challenging to manage. 

Industrial waste disposal systems usually have a high number of inspection check points high up in chimneys to disperse fumes. Advantech's LoraWAN wireless IoT sensing devices, WISE-6610 and WISE-2410, can automatically and remotely monitor systems, making them a perfect facility monitoring solution for waste disposal systems.

Wafer testing is a crucial step during semiconductor device fabrication. It is performed by wafer prober machines, which are needed to precisely measure electrical characteristics. 

High intensity digital I/O devices, such as Advantech PCIE-1753, are used to control peripheral switches/devices that can precisely position the wafer. PCIE-1812 and PCIE-1824 met wafer testing needs for analog output to accurately measure electrical characteristics of each wafer. 

And with Advantech’s comprehensive data acquisition devices and DAQNavi software development kit, customers could effectively control costs and shorten times for building wafer testing machines.

A leading semiconductor company in Taiwan adopted Advantech's ADAM-6217 industrial remote I/O modules and EKI-2728 switch for robots and CVD/PVD machine data acquisition and analysis. The collaboration improved management capabilities, machine efficiency, stability, and scalability.

Advantech’s machine vision edge solution was installed as the CMP system which included CMP machinery, robotic handling system, a vision inspection system, and uplink data for the IT database. 

Our machine vision inspection system integrates the global shutter, high speed industrial cameras, a multi-channel

computing platform, and VisionNavi software designed with a graphical and flowchart-based interface, where users can easily deploy the vision inspection applications without any programming skills.

One renowned semiconductor manufacturer in Taiwan leveraged Advantech's WISE-6610 and WISE-2410 LoRaWAN wireless IoT sensing devices to automatically and remotely monitor waste disposal systems which had inspection check points high up in chimneys. This meant they were able to reduce the risks to maintenance staff.

Advantech's PCIE-1753, PCIE-1812, and PCIE-1824 data acquisition (DAQ) devices empowered a water probing equipment builder in Taiwan to control up to 96 peripheral limited switches/devices. This helped them accurately measure electrical characteristics of each wafer via analog output. 

With these advanced DAQ devices and DAQNavi software development kit, customers can effectively control costs and shorten time for building wafer testing machines.